Tataroğlu, A. Et Al. 2005. Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure. MICROELECTRONIC ENGINEERING , vol.81, no.1 , 140-149.

Tataroğlu, A., Altindal, Ş., & Bulbul, M. M., (2005). Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure. MICROELECTRONIC ENGINEERING , vol.81, no.1, 140-149.

Tataroğlu, ADEM, ŞEMSETTİN ALTINDAL, And MEHMET MAHİR BÜLBÜL. "Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure," MICROELECTRONIC ENGINEERING , vol.81, no.1, 140-149, 2005

Tataroğlu, ADEM Et Al. "Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure." MICROELECTRONIC ENGINEERING , vol.81, no.1, pp.140-149, 2005

Tataroğlu, A. Altindal, Ş. And Bulbul, M. M. (2005) . "Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure." MICROELECTRONIC ENGINEERING , vol.81, no.1, pp.140-149.

@article{article, author={ADEM TATAROĞLU Et Al. }, title={Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure}, journal={MICROELECTRONIC ENGINEERING}, year=2005, pages={140-149} }