Guzelcimen, F. Et Al. 2020. The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM. VACUUM , vol.182 .

Guzelcimen, F., Tanoren, B., Cetinkaya, C., Kaya, M., Efkere, H. İ., Özen, Y., ... Bingol, D.(2020). The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM. VACUUM , vol.182.

Guzelcimen, Feyza Et Al. "The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM," VACUUM , vol.182, 2020

Guzelcimen, Feyza Et Al. "The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM." VACUUM , vol.182, 2020

Guzelcimen, F. Et Al. (2020) . "The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM." VACUUM , vol.182.

@article{article, author={Feyza Guzelcimen Et Al. }, title={The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM}, journal={VACUUM}, year=2020}