Kurt, H. H. Et Al. 2004. Fractal processing for an analysis of the quality and resistivity of large semiconductor plates. CRYSTAL RESEARCH AND TECHNOLOGY , no.9 , 743-753.

Kurt, H. H., Kurt, E., & Salamov, B., (2004). Fractal processing for an analysis of the quality and resistivity of large semiconductor plates. CRYSTAL RESEARCH AND TECHNOLOGY , no.9, 743-753.

Kurt, HATİCE, EROL KURT, And BG Salamov. "Fractal processing for an analysis of the quality and resistivity of large semiconductor plates," CRYSTAL RESEARCH AND TECHNOLOGY , no.9, 743-753, 2004

Kurt, HATİCE H. Et Al. "Fractal processing for an analysis of the quality and resistivity of large semiconductor plates." CRYSTAL RESEARCH AND TECHNOLOGY , no.9, pp.743-753, 2004

Kurt, H. H. Kurt, E. And Salamov, B. (2004) . "Fractal processing for an analysis of the quality and resistivity of large semiconductor plates." CRYSTAL RESEARCH AND TECHNOLOGY , no.9, pp.743-753.

@article{article, author={HATİCE HİLAL YÜCEL Et Al. }, title={Fractal processing for an analysis of the quality and resistivity of large semiconductor plates}, journal={CRYSTAL RESEARCH AND TECHNOLOGY}, year=2004, pages={743-753} }