Pakma, O. Et Al. 2008. The influence of series resistance and interface states on intersecting behavior of I-V characteristics of Al/TiO2/p-Si (MIS) structures at low temperatures. SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.10 .

Pakma, O., Serin, N., Serin, T., & Altindal, Ş., (2008). The influence of series resistance and interface states on intersecting behavior of I-V characteristics of Al/TiO2/p-Si (MIS) structures at low temperatures. SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.10.

Pakma, O. Et Al. "The influence of series resistance and interface states on intersecting behavior of I-V characteristics of Al/TiO2/p-Si (MIS) structures at low temperatures," SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.10, 2008

Pakma, O. Et Al. "The influence of series resistance and interface states on intersecting behavior of I-V characteristics of Al/TiO2/p-Si (MIS) structures at low temperatures." SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.10, 2008

Pakma, O. Et Al. (2008) . "The influence of series resistance and interface states on intersecting behavior of I-V characteristics of Al/TiO2/p-Si (MIS) structures at low temperatures." SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.10.

@article{article, author={O. Pakma Et Al. }, title={The influence of series resistance and interface states on intersecting behavior of I-V characteristics of Al/TiO2/p-Si (MIS) structures at low temperatures}, journal={SEMICONDUCTOR SCIENCE AND TECHNOLOGY}, year=2008}