Onaran, A. G. Et Al. 2008. Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization. Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition , (Hong Kong).

Onaran, A. G., BALANTEKİN, M., & Değertekin, F. L., (2008). Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization . Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition, Hong Kong

Onaran, A, MÜJDAT BALANTEKİN, And F Levent Değertekin. "Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization," Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition, Hong Kong, 2008

Onaran, A G. Et Al. "Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization." Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition , Hong Kong, 2008

Onaran, A. G. BALANTEKİN, M. And Değertekin, F. L. (2008) . "Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization." Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition , Hong Kong.

@conferencepaper{conferencepaper, author={A Güçlü Onaran Et Al. }, title={Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization}, congress name={Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition}, city={}, country={Hong Kong}, year={2008}}