S. Dulkadir Et Al. , "The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.15, pp.12514-12521, 2020
Dulkadir, S. Et Al. 2020. The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.15 , 12514-12521.
Dulkadir, S., Tecimer, H. U., Parlakturk, F., Altmdar, S., & Karal, O., (2020). The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.15, 12514-12521.
Dulkadir, S. Et Al. "The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.15, 12514-12521, 2020
Dulkadir, S. Et Al. "The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.15, pp.12514-12521, 2020
Dulkadir, S. Et Al. (2020) . "The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.15, pp.12514-12521.
@article{article, author={S. Dulkadir Et Al. }, title={The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2020, pages={12514-12521} }