Y. Özen, "Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range," SILICON , vol.13, no.9, pp.3011-3016, 2021
Özen, Y. 2021. Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range. SILICON , vol.13, no.9 , 3011-3016.
Özen, Y., (2021). Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range. SILICON , vol.13, no.9, 3011-3016.
Özen, YUNUS. "Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range," SILICON , vol.13, no.9, 3011-3016, 2021
Özen, YUNUS. "Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range." SILICON , vol.13, no.9, pp.3011-3016, 2021
Özen, Y. (2021) . "Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range." SILICON , vol.13, no.9, pp.3011-3016.
@article{article, author={YUNUS ÖZEN}, title={Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range}, journal={SILICON}, year=2021, pages={3011-3016} }