Ulusoy, M. Et Al. 2021. Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures. Journal of Materials Science: Materials in Electronics , vol.32, no.10 , 13693-13707.

Ulusoy, M., Altındal, Ş., Durmus, P., Ozcelik, S., & Azızıan-Kalandaragh, Y., (2021). Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures. Journal of Materials Science: Materials in Electronics , vol.32, no.10, 13693-13707.

Ulusoy, MURAT Et Al. "Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures," Journal of Materials Science: Materials in Electronics , vol.32, no.10, 13693-13707, 2021

Ulusoy, MURAT Et Al. "Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures." Journal of Materials Science: Materials in Electronics , vol.32, no.10, pp.13693-13707, 2021

Ulusoy, M. Et Al. (2021) . "Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures." Journal of Materials Science: Materials in Electronics , vol.32, no.10, pp.13693-13707.

@article{article, author={MURAT ULUSOY Et Al. }, title={Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures}, journal={Journal of Materials Science: Materials in Electronics}, year=2021, pages={13693-13707} }