Lişesivdin, B. 2008. Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction. FİZİKA , vol.1 , 179-183.

Lişesivdin, B., (2008). Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction. FİZİKA , vol.1, 179-183.

Lişesivdin, BEYZA. " Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction," FİZİKA , vol.1, 179-183, 2008

Lişesivdin, BEYZA. " Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction." FİZİKA , vol.1, pp.179-183, 2008

Lişesivdin, B. (2008) . " Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction." FİZİKA , vol.1, pp.179-183.

@article{article, author={BEYZA LİŞESİVDİN}, title={ Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction}, journal={FİZİKA}, year=2008, pages={179-183} }