EVANS, J. Et Al. 1995. MINORITY AND MAJORITY CARRIER TRAPS ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN SILICON. MATERIALS SCIENCE AND TECHNOLOGY , vol.11, no.7 , 696-701.

EVANS, J., DAVIDSON, J., SARITAS, M., VANDINI, M., QIAN, Y., & PEAKER, A., (1995). MINORITY AND MAJORITY CARRIER TRAPS ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN SILICON. MATERIALS SCIENCE AND TECHNOLOGY , vol.11, no.7, 696-701.

EVANS, JH Et Al. "MINORITY AND MAJORITY CARRIER TRAPS ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN SILICON," MATERIALS SCIENCE AND TECHNOLOGY , vol.11, no.7, 696-701, 1995

EVANS, JH Et Al. "MINORITY AND MAJORITY CARRIER TRAPS ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN SILICON." MATERIALS SCIENCE AND TECHNOLOGY , vol.11, no.7, pp.696-701, 1995

EVANS, J. Et Al. (1995) . "MINORITY AND MAJORITY CARRIER TRAPS ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN SILICON." MATERIALS SCIENCE AND TECHNOLOGY , vol.11, no.7, pp.696-701.

@article{article, author={JH EVANS Et Al. }, title={MINORITY AND MAJORITY CARRIER TRAPS ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN SILICON}, journal={MATERIALS SCIENCE AND TECHNOLOGY}, year=1995, pages={696-701} }