Altindal, Ş. Et Al. 2010. Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.12, no.10 , 2139-2144.

Altindal, Ş., Parlakturk, F., TATAROĞLU, A., & Bulbul, M. M., (2010). Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.12, no.10, 2139-2144.

Altindal, ŞEMSETTİN Et Al. "Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures," JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.12, no.10, 2139-2144, 2010

Altindal, ŞEMSETTİN Et Al. "Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures." JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.12, no.10, pp.2139-2144, 2010

Altindal, Ş. Et Al. (2010) . "Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures." JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.12, no.10, pp.2139-2144.

@article{article, author={ŞEMSETTİN ALTINDAL Et Al. }, title={Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures}, journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS}, year=2010, pages={2139-2144} }