Arslan, E. Et Al. 2011. Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes. MICROELECTRONICS RELIABILITY , vol.51, no.3 , 576-580.

Arslan, E., Butun, S., ŞAFAK ASAR, Y., Cakmak, H., Yu, H., & ÖZBAY, E., (2011). Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes. MICROELECTRONICS RELIABILITY , vol.51, no.3, 576-580.

Arslan, Engin Et Al. "Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes," MICROELECTRONICS RELIABILITY , vol.51, no.3, 576-580, 2011

Arslan, Engin Et Al. "Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes." MICROELECTRONICS RELIABILITY , vol.51, no.3, pp.576-580, 2011

Arslan, E. Et Al. (2011) . "Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes." MICROELECTRONICS RELIABILITY , vol.51, no.3, pp.576-580.

@article{article, author={Engin Arslan Et Al. }, title={Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes}, journal={MICROELECTRONICS RELIABILITY}, year=2011, pages={576-580} }