Emir, C. Et Al. 2025. Analysis of the structural and optical characteristics of ZnSe thin flms as interface layer. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.36, no.168 , 1-12.

Emir, C., Tataroğlu, A., Gökmen, U., & Bilge Ocak, S., (2025). Analysis of the structural and optical characteristics of ZnSe thin flms as interface layer. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.36, no.168, 1-12.

Emir, Cansu Et Al. "Analysis of the structural and optical characteristics of ZnSe thin flms as interface layer," JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.36, no.168, 1-12, 2025

Emir, Cansu Et Al. "Analysis of the structural and optical characteristics of ZnSe thin flms as interface layer." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.36, no.168, pp.1-12, 2025

Emir, C. Et Al. (2025) . "Analysis of the structural and optical characteristics of ZnSe thin flms as interface layer." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.36, no.168, pp.1-12.

@article{article, author={Cansu Emir Et Al. }, title={Analysis of the structural and optical characteristics of ZnSe thin flms as interface layer}, journal={JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS}, year=2025, pages={1-12} }