Arslan, E. Et Al. 2011. Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures. MICROELECTRONICS RELIABILITY , vol.51, no.2 , 370-375.

Arslan, E., Butun, S., ŞAFAK ASAR, Y., Uslu, H., Tascioglu, I., ALTINDAL, Ş., ... ÖZBAY, E.(2011). Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures. MICROELECTRONICS RELIABILITY , vol.51, no.2, 370-375.

Arslan, Engin Et Al. "Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures," MICROELECTRONICS RELIABILITY , vol.51, no.2, 370-375, 2011

Arslan, Engin Et Al. "Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures." MICROELECTRONICS RELIABILITY , vol.51, no.2, pp.370-375, 2011

Arslan, E. Et Al. (2011) . "Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures." MICROELECTRONICS RELIABILITY , vol.51, no.2, pp.370-375.

@article{article, author={Engin Arslan Et Al. }, title={Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures}, journal={MICROELECTRONICS RELIABILITY}, year=2011, pages={370-375} }