Ş. ALTINDAL Et Al. , "The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions," 1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015 , Elazığ, Turkey, pp.140, 2015
ALTINDAL, Ş. Et Al. 2015. The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions. 1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015 , (Elazığ, Turkey), 140.
ALTINDAL, Ş., KAYA, A., Demirezen, S., & USLU, İ., (2015). The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions . 1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015 (pp.140). Elazığ, Turkey
ALTINDAL, ŞEMSETTİN Et Al. "The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions," 1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015, Elazığ, Turkey, 2015
ALTINDAL, ŞEMSETTİN Et Al. "The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions." 1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015 , Elazığ, Turkey, pp.140, 2015
ALTINDAL, Ş. Et Al. (2015) . "The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions." 1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015 , Elazığ, Turkey, p.140.
@conferencepaper{conferencepaper, author={ŞEMSETTİN ALTINDAL Et Al. }, title={The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions}, congress name={1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015}, city={Elazığ}, country={Turkey}, year={2015}, pages={140} }