Berkün, Ö. Et Al. 2023. On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer. PHYSICA B: CONDENSED MATTER , vol.666 , 415099.

Berkün, Ö., Ulusoy, M., Altındal, Ş., & Avar, B., (2023). On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer. PHYSICA B: CONDENSED MATTER , vol.666, 415099.

Berkün, Ö. Et Al. "On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer," PHYSICA B: CONDENSED MATTER , vol.666, 415099, 2023

Berkün, Ö. Et Al. "On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer." PHYSICA B: CONDENSED MATTER , vol.666, pp.415099, 2023

Berkün, Ö. Et Al. (2023) . "On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer." PHYSICA B: CONDENSED MATTER , vol.666, p.415099.

@article{article, author={Ö. Berkün Et Al. }, title={On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer}, journal={PHYSICA B: CONDENSED MATTER}, year=2023, pages={415099} }