Bengi, S. Et Al. 2023. Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range. Journal of Materials Science: Materials in Electronics , vol.34, no.3 .

Bengi, S., Yükseltürk, E., & BÜLBÜL, M. M., (2023). Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range. Journal of Materials Science: Materials in Electronics , vol.34, no.3.

Bengi, Seda, Esra Yükseltürk, And MEHMET MAHİR BÜLBÜL. "Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range," Journal of Materials Science: Materials in Electronics , vol.34, no.3, 2023

Bengi, Seda Et Al. "Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range." Journal of Materials Science: Materials in Electronics , vol.34, no.3, 2023

Bengi, S. Yükseltürk, E. And BÜLBÜL, M. M. (2023) . "Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range." Journal of Materials Science: Materials in Electronics , vol.34, no.3.

@article{article, author={Seda Bengi Et Al. }, title={Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range}, journal={Journal of Materials Science: Materials in Electronics}, year=2023}