Safran, S. Et Al. 2020. Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.31 , 20578-20588.

Safran, S., Bulut, F., A. R. A. Nefrow, A. R. A., Ada, H., & Öztürk, Ö., (2020). Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.31, 20578-20588.

Safran, Serap Et Al. "Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties," JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.31, 20578-20588, 2020

Safran, Serap Et Al. "Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.31, pp.20578-20588, 2020

Safran, S. Et Al. (2020) . "Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.31, pp.20578-20588.

@article{article, author={Serap Safran Et Al. }, title={Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties}, journal={JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS}, year=2020, pages={20578-20588} }