Bengi, S. Et Al. 2024. Investigation of the frequency effect on electrical modulus and dielectric properties of Al/p-Si structure with %0.5 Bi:ZnO interfacial layer. Ionics , vol.30, no.6 , 3651-3659.

Bengi, S., ÇETİNKAYA, H. G., ALTINDAL, Ş., & DURMUŞ, P., (2024). Investigation of the frequency effect on electrical modulus and dielectric properties of Al/p-Si structure with %0.5 Bi:ZnO interfacial layer. Ionics , vol.30, no.6, 3651-3659.

Bengi, S. Et Al. "Investigation of the frequency effect on electrical modulus and dielectric properties of Al/p-Si structure with %0.5 Bi:ZnO interfacial layer," Ionics , vol.30, no.6, 3651-3659, 2024

Bengi, S. Et Al. "Investigation of the frequency effect on electrical modulus and dielectric properties of Al/p-Si structure with %0.5 Bi:ZnO interfacial layer." Ionics , vol.30, no.6, pp.3651-3659, 2024

Bengi, S. Et Al. (2024) . "Investigation of the frequency effect on electrical modulus and dielectric properties of Al/p-Si structure with %0.5 Bi:ZnO interfacial layer." Ionics , vol.30, no.6, pp.3651-3659.

@article{article, author={S. Bengi Et Al. }, title={Investigation of the frequency effect on electrical modulus and dielectric properties of Al/p-Si structure with %0.5 Bi:ZnO interfacial layer}, journal={Ionics}, year=2024, pages={3651-3659} }