TATAROĞLU, A. And Altindal, Ş. 2006. Characterization of current-voltage (I-V) and capacitance-voltage-frequency (C-V-f) features of Al/SiO2/p-Si (MIS) Schottky diodes. MICROELECTRONIC ENGINEERING , vol.83, no.3 , 582-588.

TATAROĞLU, A., & Altindal, Ş., (2006). Characterization of current-voltage (I-V) and capacitance-voltage-frequency (C-V-f) features of Al/SiO2/p-Si (MIS) Schottky diodes. MICROELECTRONIC ENGINEERING , vol.83, no.3, 582-588.

TATAROĞLU, ADEM, And ŞEMSETTİN ALTINDAL. "Characterization of current-voltage (I-V) and capacitance-voltage-frequency (C-V-f) features of Al/SiO2/p-Si (MIS) Schottky diodes," MICROELECTRONIC ENGINEERING , vol.83, no.3, 582-588, 2006

TATAROĞLU, ADEM And Altindal, ŞEMSETTİN. "Characterization of current-voltage (I-V) and capacitance-voltage-frequency (C-V-f) features of Al/SiO2/p-Si (MIS) Schottky diodes." MICROELECTRONIC ENGINEERING , vol.83, no.3, pp.582-588, 2006

TATAROĞLU, A. And Altindal, Ş. (2006) . "Characterization of current-voltage (I-V) and capacitance-voltage-frequency (C-V-f) features of Al/SiO2/p-Si (MIS) Schottky diodes." MICROELECTRONIC ENGINEERING , vol.83, no.3, pp.582-588.

@article{article, author={ADEM TATAROĞLU And author={ŞEMSETTİN ALTINDAL}, title={Characterization of current-voltage (I-V) and capacitance-voltage-frequency (C-V-f) features of Al/SiO2/p-Si (MIS) Schottky diodes}, journal={MICROELECTRONIC ENGINEERING}, year=2006, pages={582-588} }