İzdeş, M. Et Al. 2024. Influence of ionizing radiation on admittance measurements of Au/TiO2/n-Si (MIS) capacitor. Journal of Materials Science: Materials in Electronics , vol.35, no.6 .

İzdeş, M., Ertuğrul Uyar, R., & TATAROĞLU, A., (2024). Influence of ionizing radiation on admittance measurements of Au/TiO2/n-Si (MIS) capacitor. Journal of Materials Science: Materials in Electronics , vol.35, no.6.

İzdeş, Mehmet, Raziye Ertuğrul Uyar, And ADEM TATAROĞLU. "Influence of ionizing radiation on admittance measurements of Au/TiO2/n-Si (MIS) capacitor," Journal of Materials Science: Materials in Electronics , vol.35, no.6, 2024

İzdeş, Mehmet Et Al. "Influence of ionizing radiation on admittance measurements of Au/TiO2/n-Si (MIS) capacitor." Journal of Materials Science: Materials in Electronics , vol.35, no.6, 2024

İzdeş, M. Ertuğrul Uyar, R. And TATAROĞLU, A. (2024) . "Influence of ionizing radiation on admittance measurements of Au/TiO2/n-Si (MIS) capacitor." Journal of Materials Science: Materials in Electronics , vol.35, no.6.

@article{article, author={Mehmet İzdeş Et Al. }, title={Influence of ionizing radiation on admittance measurements of Au/TiO2/n-Si (MIS) capacitor}, journal={Journal of Materials Science: Materials in Electronics}, year=2024}