Erenler, B. Et Al. 2019. Characterization of MoS2 thin films on SiO2/Si substrates prepared by sulfurization of sputtered Mo precursors. Turkish Physical Society 35th International Physics Congress (TFD 35) , (Muğla, Turkey).

Erenler, B., Akçay, N., Tıvanov, M., & Özçelik, S., (2019). Characterization of MoS2 thin films on SiO2/Si substrates prepared by sulfurization of sputtered Mo precursors . Turkish Physical Society 35th International Physics Congress (TFD 35), Muğla, Turkey

Erenler, Berkcan Et Al. "Characterization of MoS2 thin films on SiO2/Si substrates prepared by sulfurization of sputtered Mo precursors," Turkish Physical Society 35th International Physics Congress (TFD 35), Muğla, Turkey, 2019

Erenler, Berkcan Et Al. "Characterization of MoS2 thin films on SiO2/Si substrates prepared by sulfurization of sputtered Mo precursors." Turkish Physical Society 35th International Physics Congress (TFD 35) , Muğla, Turkey, 2019

Erenler, B. Et Al. (2019) . "Characterization of MoS2 thin films on SiO2/Si substrates prepared by sulfurization of sputtered Mo precursors." Turkish Physical Society 35th International Physics Congress (TFD 35) , Muğla, Turkey.

@conferencepaper{conferencepaper, author={Berkcan Erenler Et Al. }, title={Characterization of MoS2 thin films on SiO2/Si substrates prepared by sulfurization of sputtered Mo precursors}, congress name={Turkish Physical Society 35th International Physics Congress (TFD 35)}, city={Muğla}, country={Turkey}, year={2019}}