Yildiz, A. Et Al. 2009. Structural, electrical and optical characterization of InGaN layers grown by MOVPE. CHINESE PHYSICS B , vol.18, no.9 , 4007-4012.

Yildiz, A., Kemal, O. M., Bosi, M., Ozcelik, S., & Kasap, M., (2009). Structural, electrical and optical characterization of InGaN layers grown by MOVPE. CHINESE PHYSICS B , vol.18, no.9, 4007-4012.

Yildiz, A. Et Al. "Structural, electrical and optical characterization of InGaN layers grown by MOVPE," CHINESE PHYSICS B , vol.18, no.9, 4007-4012, 2009

Yildiz, A. Et Al. "Structural, electrical and optical characterization of InGaN layers grown by MOVPE." CHINESE PHYSICS B , vol.18, no.9, pp.4007-4012, 2009

Yildiz, A. Et Al. (2009) . "Structural, electrical and optical characterization of InGaN layers grown by MOVPE." CHINESE PHYSICS B , vol.18, no.9, pp.4007-4012.

@article{article, author={A. Yildiz Et Al. }, title={Structural, electrical and optical characterization of InGaN layers grown by MOVPE}, journal={CHINESE PHYSICS B}, year=2009, pages={4007-4012} }