Ekinci, N. Et Al. 2002. Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry. RADIATION MEASUREMENTS , vol.35, no.3 , 223-227.

Ekinci, N., Kurucu, Y., Oz, E., & Sahin, Y., (2002). Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry. RADIATION MEASUREMENTS , vol.35, no.3, 223-227.

Ekinci, N Et Al. "Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry," RADIATION MEASUREMENTS , vol.35, no.3, 223-227, 2002

Ekinci, N Et Al. "Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry." RADIATION MEASUREMENTS , vol.35, no.3, pp.223-227, 2002

Ekinci, N. Et Al. (2002) . "Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry." RADIATION MEASUREMENTS , vol.35, no.3, pp.223-227.

@article{article, author={N Ekinci Et Al. }, title={Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry}, journal={RADIATION MEASUREMENTS}, year=2002, pages={223-227} }