Cetinkaya, H. G. 2018. Frequency and Voltage Dependent Profile of Dielectric Parameters and Electric Modulus for Al/(HgS-PVA)/p-Si Capacitor via Impedance Spectroscopy Method. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.13, no.3 , 421-427.

Cetinkaya, H. G., (2018). Frequency and Voltage Dependent Profile of Dielectric Parameters and Electric Modulus for Al/(HgS-PVA)/p-Si Capacitor via Impedance Spectroscopy Method. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.13, no.3, 421-427.

Cetinkaya, HAYRİYE. "Frequency and Voltage Dependent Profile of Dielectric Parameters and Electric Modulus for Al/(HgS-PVA)/p-Si Capacitor via Impedance Spectroscopy Method," JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.13, no.3, 421-427, 2018

Cetinkaya, HAYRİYE G. . "Frequency and Voltage Dependent Profile of Dielectric Parameters and Electric Modulus for Al/(HgS-PVA)/p-Si Capacitor via Impedance Spectroscopy Method." JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.13, no.3, pp.421-427, 2018

Cetinkaya, H. G. (2018) . "Frequency and Voltage Dependent Profile of Dielectric Parameters and Electric Modulus for Al/(HgS-PVA)/p-Si Capacitor via Impedance Spectroscopy Method." JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.13, no.3, pp.421-427.

@article{article, author={HAYRİYE GÖKÇEN ÇETİNKAYA}, title={Frequency and Voltage Dependent Profile of Dielectric Parameters and Electric Modulus for Al/(HgS-PVA)/p-Si Capacitor via Impedance Spectroscopy Method}, journal={JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS}, year=2018, pages={421-427} }