E. MARIL Et Al. , "Evaluation of Electric and Dielectric Properties of Metal-Semiconductor Structures With 2% GC-Doped-(Ca3Co4Ga0.001Ox) Interlayer," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.65, no.9, pp.3901-3908, 2018
MARIL, E. Et Al. 2018. Evaluation of Electric and Dielectric Properties of Metal-Semiconductor Structures With 2% GC-Doped-(Ca3Co4Ga0.001Ox) Interlayer. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.65, no.9 , 3901-3908.
MARIL, E., TAN, S. O., ALTINDAL, Ş., & USLU, İ., (2018). Evaluation of Electric and Dielectric Properties of Metal-Semiconductor Structures With 2% GC-Doped-(Ca3Co4Ga0.001Ox) Interlayer. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.65, no.9, 3901-3908.
MARIL, ELİF Et Al. "Evaluation of Electric and Dielectric Properties of Metal-Semiconductor Structures With 2% GC-Doped-(Ca3Co4Ga0.001Ox) Interlayer," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.65, no.9, 3901-3908, 2018
MARIL, ELİF Et Al. "Evaluation of Electric and Dielectric Properties of Metal-Semiconductor Structures With 2% GC-Doped-(Ca3Co4Ga0.001Ox) Interlayer." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.65, no.9, pp.3901-3908, 2018
MARIL, E. Et Al. (2018) . "Evaluation of Electric and Dielectric Properties of Metal-Semiconductor Structures With 2% GC-Doped-(Ca3Co4Ga0.001Ox) Interlayer." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.65, no.9, pp.3901-3908.
@article{article, author={ELİF MARIL Et Al. }, title={Evaluation of Electric and Dielectric Properties of Metal-Semiconductor Structures With 2% GC-Doped-(Ca3Co4Ga0.001Ox) Interlayer}, journal={IEEE TRANSACTIONS ON ELECTRON DEVICES}, year=2018, pages={3901-3908} }