Ataseven, T. Et Al. 2012. Influence of frequency on electrical and dielectric properties of Au/Si3N4/n-Si (MIS) structures. Journal of Optoelectronics and Advanced Materials , vol.14 , 640-645.

Ataseven, T., TATAROĞLU, A., Memmedli, T., & Ozcelik, S., (2012). Influence of frequency on electrical and dielectric properties of Au/Si3N4/n-Si (MIS) structures. Journal of Optoelectronics and Advanced Materials , vol.14, 640-645.

Ataseven, T. Et Al. "Influence of frequency on electrical and dielectric properties of Au/Si3N4/n-Si (MIS) structures," Journal of Optoelectronics and Advanced Materials , vol.14, 640-645, 2012

Ataseven, T. Et Al. "Influence of frequency on electrical and dielectric properties of Au/Si3N4/n-Si (MIS) structures." Journal of Optoelectronics and Advanced Materials , vol.14, pp.640-645, 2012

Ataseven, T. Et Al. (2012) . "Influence of frequency on electrical and dielectric properties of Au/Si3N4/n-Si (MIS) structures." Journal of Optoelectronics and Advanced Materials , vol.14, pp.640-645.

@article{article, author={T. Ataseven Et Al. }, title={Influence of frequency on electrical and dielectric properties of Au/Si3N4/n-Si (MIS) structures}, journal={Journal of Optoelectronics and Advanced Materials}, year=2012, pages={640-645} }