Buyukbas-Ulusan, A. And Tataroglu, A. 2020. Electrical characterization of silicon nitride interlayer-based MIS diode. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12 , 9888-9893.

Buyukbas-Ulusan, A., & Tataroglu, A., (2020). Electrical characterization of silicon nitride interlayer-based MIS diode. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, 9888-9893.

Buyukbas-Ulusan, A., And ADEM TATAROĞLU. "Electrical characterization of silicon nitride interlayer-based MIS diode," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, 9888-9893, 2020

Buyukbas-Ulusan, A. And Tataroglu, ADEM. "Electrical characterization of silicon nitride interlayer-based MIS diode." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, pp.9888-9893, 2020

Buyukbas-Ulusan, A. And Tataroglu, A. (2020) . "Electrical characterization of silicon nitride interlayer-based MIS diode." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, pp.9888-9893.

@article{article, author={A. Buyukbas-Ulusan And author={ADEM TATAROĞLU}, title={Electrical characterization of silicon nitride interlayer-based MIS diode}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2020, pages={9888-9893} }