P. DURMUŞ And M. YILDIRIM, "Influence of interfacial layer thickness on frequency dependent dielectric properties and electrical conductivity in Al/Bi4Ti3O12/p-Si structures," JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , vol.32, no.6, 2014
DURMUŞ, P. And YILDIRIM, M. 2014. Influence of interfacial layer thickness on frequency dependent dielectric properties and electrical conductivity in Al/Bi4Ti3O12/p-Si structures. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , vol.32, no.6 .
DURMUŞ, P., & YILDIRIM, M., (2014). Influence of interfacial layer thickness on frequency dependent dielectric properties and electrical conductivity in Al/Bi4Ti3O12/p-Si structures. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , vol.32, no.6.
DURMUŞ, PERİHAN, And MERT YILDIRIM. "Influence of interfacial layer thickness on frequency dependent dielectric properties and electrical conductivity in Al/Bi4Ti3O12/p-Si structures," JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , vol.32, no.6, 2014
DURMUŞ, PERİHAN And YILDIRIM, MERT. "Influence of interfacial layer thickness on frequency dependent dielectric properties and electrical conductivity in Al/Bi4Ti3O12/p-Si structures." JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , vol.32, no.6, 2014
DURMUŞ, P. And YILDIRIM, M. (2014) . "Influence of interfacial layer thickness on frequency dependent dielectric properties and electrical conductivity in Al/Bi4Ti3O12/p-Si structures." JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , vol.32, no.6.
@article{article, author={PERİHAN DURMUŞ And author={MERT YILDIRIM}, title={Influence of interfacial layer thickness on frequency dependent dielectric properties and electrical conductivity in Al/Bi4Ti3O12/p-Si structures}, journal={JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A}, year=2014}