YILDIRIM, M. Et Al. 2013. Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p-Si and Al/Bi4Ti3O12/p-Si structures by using the admittance spectroscopy method. CHINESE PHYSICS B , vol.22, no.10 .

YILDIRIM, M., DURMUŞ, P., & ALTINDAL, Ş., (2013). Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p-Si and Al/Bi4Ti3O12/p-Si structures by using the admittance spectroscopy method. CHINESE PHYSICS B , vol.22, no.10.

YILDIRIM, MERT, PERİHAN DURMUŞ, And ŞEMSETTİN ALTINDAL. "Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p-Si and Al/Bi4Ti3O12/p-Si structures by using the admittance spectroscopy method," CHINESE PHYSICS B , vol.22, no.10, 2013

YILDIRIM, MERT Et Al. "Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p-Si and Al/Bi4Ti3O12/p-Si structures by using the admittance spectroscopy method." CHINESE PHYSICS B , vol.22, no.10, 2013

YILDIRIM, M. DURMUŞ, P. And ALTINDAL, Ş. (2013) . "Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p-Si and Al/Bi4Ti3O12/p-Si structures by using the admittance spectroscopy method." CHINESE PHYSICS B , vol.22, no.10.

@article{article, author={MERT YILDIRIM Et Al. }, title={Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p-Si and Al/Bi4Ti3O12/p-Si structures by using the admittance spectroscopy method}, journal={CHINESE PHYSICS B}, year=2013}