Tekeli, Z. Et Al. 2011. On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures. MICROELECTRONICS RELIABILITY , vol.51, no.3 , 581-586.

Tekeli, Z., Gokcen, M., Altindal, Ş., Ozcelik, S., & Ozbay, E., (2011). On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures. MICROELECTRONICS RELIABILITY , vol.51, no.3, 581-586.

Tekeli, Z. Et Al. "On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures," MICROELECTRONICS RELIABILITY , vol.51, no.3, 581-586, 2011

Tekeli, Z. Et Al. "On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures." MICROELECTRONICS RELIABILITY , vol.51, no.3, pp.581-586, 2011

Tekeli, Z. Et Al. (2011) . "On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures." MICROELECTRONICS RELIABILITY , vol.51, no.3, pp.581-586.

@article{article, author={Z. Tekeli Et Al. }, title={On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures}, journal={MICROELECTRONICS RELIABILITY}, year=2011, pages={581-586} }