Oruç, P. Et Al. 2024. Investigation of Terp-Pyr/p-Si diode using complex impedance spectroscopy depending on measurement temperatures and frequencies. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.314 , 1-13.

Oruç, P., Tuğluoğlu, N., & Eymur, S., (2024). Investigation of Terp-Pyr/p-Si diode using complex impedance spectroscopy depending on measurement temperatures and frequencies. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.314, 1-13.

Oruç, PINAR, Nihat Tuğluoğlu, And Serkan Eymur. "Investigation of Terp-Pyr/p-Si diode using complex impedance spectroscopy depending on measurement temperatures and frequencies," JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.314, 1-13, 2024

Oruç, PINAR Et Al. "Investigation of Terp-Pyr/p-Si diode using complex impedance spectroscopy depending on measurement temperatures and frequencies." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.314, pp.1-13, 2024

Oruç, P. Tuğluoğlu, N. And Eymur, S. (2024) . "Investigation of Terp-Pyr/p-Si diode using complex impedance spectroscopy depending on measurement temperatures and frequencies." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.314, pp.1-13.

@article{article, author={PINAR ORUÇ Et Al. }, title={Investigation of Terp-Pyr/p-Si diode using complex impedance spectroscopy depending on measurement temperatures and frequencies}, journal={JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS}, year=2024, pages={1-13} }