E. Efil Et Al. , "Frequency dependent dielectric properties of atomic layer deposition grown zinc-oxide based MIS structure," PHYSICA B-CONDENSED MATTER , vol.568, pp.31-35, 2019
Efil, E. Et Al. 2019. Frequency dependent dielectric properties of atomic layer deposition grown zinc-oxide based MIS structure. PHYSICA B-CONDENSED MATTER , vol.568 , 31-35.
Efil, E., Kaymak, N., Seven, E., Tataroglu, A., Ocak, S., & Orhan, E., (2019). Frequency dependent dielectric properties of atomic layer deposition grown zinc-oxide based MIS structure. PHYSICA B-CONDENSED MATTER , vol.568, 31-35.
Efil, E. Et Al. "Frequency dependent dielectric properties of atomic layer deposition grown zinc-oxide based MIS structure," PHYSICA B-CONDENSED MATTER , vol.568, 31-35, 2019
Efil, E. Et Al. "Frequency dependent dielectric properties of atomic layer deposition grown zinc-oxide based MIS structure." PHYSICA B-CONDENSED MATTER , vol.568, pp.31-35, 2019
Efil, E. Et Al. (2019) . "Frequency dependent dielectric properties of atomic layer deposition grown zinc-oxide based MIS structure." PHYSICA B-CONDENSED MATTER , vol.568, pp.31-35.
@article{article, author={E. Efil Et Al. }, title={Frequency dependent dielectric properties of atomic layer deposition grown zinc-oxide based MIS structure}, journal={PHYSICA B-CONDENSED MATTER}, year=2019, pages={31-35} }