TURAN, N. 2022. Dielectric Characterization of Al/PAN/n-Si/Al Structure as a Function of Frequency and Voltage. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.8 .

TURAN, N., (2022). Dielectric Characterization of Al/PAN/n-Si/Al Structure as a Function of Frequency and Voltage. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.8.

TURAN, NESLİHAN. "Dielectric Characterization of Al/PAN/n-Si/Al Structure as a Function of Frequency and Voltage," ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.8, 2022

TURAN, NESLİHAN. "Dielectric Characterization of Al/PAN/n-Si/Al Structure as a Function of Frequency and Voltage." ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.8, 2022

TURAN, N. (2022) . "Dielectric Characterization of Al/PAN/n-Si/Al Structure as a Function of Frequency and Voltage." ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.8.

@article{article, author={NESLİHAN TURAN}, title={Dielectric Characterization of Al/PAN/n-Si/Al Structure as a Function of Frequency and Voltage}, journal={ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY}, year=2022}