TATAROĞLU, A. And Altindal, Ş. 2008. Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high-low frequency capacitance and conductance methods. MICROELECTRONIC ENGINEERING , vol.85, no.11 , 2256-2260.

TATAROĞLU, A., & Altindal, Ş., (2008). Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high-low frequency capacitance and conductance methods. MICROELECTRONIC ENGINEERING , vol.85, no.11, 2256-2260.

TATAROĞLU, ADEM, And ŞEMSETTİN ALTINDAL. "Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high-low frequency capacitance and conductance methods," MICROELECTRONIC ENGINEERING , vol.85, no.11, 2256-2260, 2008

TATAROĞLU, ADEM And Altindal, ŞEMSETTİN. "Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high-low frequency capacitance and conductance methods." MICROELECTRONIC ENGINEERING , vol.85, no.11, pp.2256-2260, 2008

TATAROĞLU, A. And Altindal, Ş. (2008) . "Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high-low frequency capacitance and conductance methods." MICROELECTRONIC ENGINEERING , vol.85, no.11, pp.2256-2260.

@article{article, author={ADEM TATAROĞLU And author={ŞEMSETTİN ALTINDAL}, title={Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high-low frequency capacitance and conductance methods}, journal={MICROELECTRONIC ENGINEERING}, year=2008, pages={2256-2260} }