Dokme, İ. Et Al. 2010. Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes. MICROELECTRONICS RELIABILITY , vol.50, no.1 , 39-44.

Dokme, İ., Altindal, Ş., Tunc, T., & Uslu, I., (2010). Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes. MICROELECTRONICS RELIABILITY , vol.50, no.1, 39-44.

Dokme, İLBİLGE Et Al. "Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes," MICROELECTRONICS RELIABILITY , vol.50, no.1, 39-44, 2010

Dokme, İLBİLGE Et Al. "Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes." MICROELECTRONICS RELIABILITY , vol.50, no.1, pp.39-44, 2010

Dokme, İ. Et Al. (2010) . "Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes." MICROELECTRONICS RELIABILITY , vol.50, no.1, pp.39-44.

@article{article, author={İLBİLGE DÖKME Et Al. }, title={Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes}, journal={MICROELECTRONICS RELIABILITY}, year=2010, pages={39-44} }