TATAROĞLU, A. And Altindal, Ş. 2008. Characterization of interface states at Au/SnO2/n-Si (MOS) structures. VACUUM , vol.82, no.11 , 1203-1207.

TATAROĞLU, A., & Altindal, Ş., (2008). Characterization of interface states at Au/SnO2/n-Si (MOS) structures. VACUUM , vol.82, no.11, 1203-1207.

TATAROĞLU, ADEM, And ŞEMSETTİN ALTINDAL. "Characterization of interface states at Au/SnO2/n-Si (MOS) structures," VACUUM , vol.82, no.11, 1203-1207, 2008

TATAROĞLU, ADEM And Altindal, ŞEMSETTİN. "Characterization of interface states at Au/SnO2/n-Si (MOS) structures." VACUUM , vol.82, no.11, pp.1203-1207, 2008

TATAROĞLU, A. And Altindal, Ş. (2008) . "Characterization of interface states at Au/SnO2/n-Si (MOS) structures." VACUUM , vol.82, no.11, pp.1203-1207.

@article{article, author={ADEM TATAROĞLU And author={ŞEMSETTİN ALTINDAL}, title={Characterization of interface states at Au/SnO2/n-Si (MOS) structures}, journal={VACUUM}, year=2008, pages={1203-1207} }