ALTINDAL, Ş. Et Al. 2010. The determination of frequency and applied bias voltage of electrical and dielectric properties of Al SiO2 p Si MOS structures. Türk Fizik Derneği 27. Uluslararası Fizik Kongresi .

ALTINDAL, Ş., ŞAFAK ASAR, Y., SÖNMEZ, Z., & KAYA, A., (2010). The determination of frequency and applied bias voltage of electrical and dielectric properties of Al SiO2 p Si MOS structures . Türk Fizik Derneği 27. Uluslararası Fizik Kongresi

ALTINDAL, ŞEMSETTİN Et Al. "The determination of frequency and applied bias voltage of electrical and dielectric properties of Al SiO2 p Si MOS structures," Türk Fizik Derneği 27. Uluslararası Fizik Kongresi, 2010

ALTINDAL, ŞEMSETTİN Et Al. "The determination of frequency and applied bias voltage of electrical and dielectric properties of Al SiO2 p Si MOS structures." Türk Fizik Derneği 27. Uluslararası Fizik Kongresi , 2010

ALTINDAL, Ş. Et Al. (2010) . "The determination of frequency and applied bias voltage of electrical and dielectric properties of Al SiO2 p Si MOS structures." Türk Fizik Derneği 27. Uluslararası Fizik Kongresi .

@conferencepaper{conferencepaper, author={ŞEMSETTİN ALTINDAL Et Al. }, title={The determination of frequency and applied bias voltage of electrical and dielectric properties of Al SiO2 p Si MOS structures}, congress name={Türk Fizik Derneği 27. Uluslararası Fizik Kongresi}, city={}, country={}, year={2010}}