DÖKME, İ. And ALTINDAL, Ş. 2011. Comparative Analysis of Temperature-Dependent Electrical and Dielectric Properties of an Al-TiW-Pd2Si/n-Si Schottky Device at Two Frequencies. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.58, no.11 , 4042-4048.

DÖKME, İ., & ALTINDAL, Ş., (2011). Comparative Analysis of Temperature-Dependent Electrical and Dielectric Properties of an Al-TiW-Pd2Si/n-Si Schottky Device at Two Frequencies. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.58, no.11, 4042-4048.

DÖKME, İLBİLGE, And ŞEMSETTİN ALTINDAL. "Comparative Analysis of Temperature-Dependent Electrical and Dielectric Properties of an Al-TiW-Pd2Si/n-Si Schottky Device at Two Frequencies," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.58, no.11, 4042-4048, 2011

DÖKME, İLBİLGE And ALTINDAL, ŞEMSETTİN. "Comparative Analysis of Temperature-Dependent Electrical and Dielectric Properties of an Al-TiW-Pd2Si/n-Si Schottky Device at Two Frequencies." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.58, no.11, pp.4042-4048, 2011

DÖKME, İ. And ALTINDAL, Ş. (2011) . "Comparative Analysis of Temperature-Dependent Electrical and Dielectric Properties of an Al-TiW-Pd2Si/n-Si Schottky Device at Two Frequencies." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.58, no.11, pp.4042-4048.

@article{article, author={İLBİLGE DÖKME And author={ŞEMSETTİN ALTINDAL}, title={Comparative Analysis of Temperature-Dependent Electrical and Dielectric Properties of an Al-TiW-Pd2Si/n-Si Schottky Device at Two Frequencies}, journal={IEEE TRANSACTIONS ON ELECTRON DEVICES}, year=2011, pages={4042-4048} }