M. Kaya Et Al. , "Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode," Applied Physics A: Materials Science and Processing , vol.126, no.11, 2020
Kaya, M. Et Al. 2020. Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode. Applied Physics A: Materials Science and Processing , vol.126, no.11 .
Kaya, M., Sertel, B. C., AKIN SÖNMEZ, N., ÇAKMAK, M., & ÖZÇELİK, S., (2020). Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode. Applied Physics A: Materials Science and Processing , vol.126, no.11.
Kaya, MELTEM Et Al. "Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode," Applied Physics A: Materials Science and Processing , vol.126, no.11, 2020
Kaya, MELTEM D. Et Al. "Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode." Applied Physics A: Materials Science and Processing , vol.126, no.11, 2020
Kaya, M. Et Al. (2020) . "Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode." Applied Physics A: Materials Science and Processing , vol.126, no.11.
@article{article, author={MELTEM DÖNMEZ KAYA Et Al. }, title={Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode}, journal={Applied Physics A: Materials Science and Processing}, year=2020}