Tascioglu, I. Et Al. 2020. Frequency-Dependent Admittance Analysis of Au/n-Si Structure with CoSO4-PVP Interfacial Layer. Journal of Electronic Materials , vol.49, no.6 , 3720-3727.

Tascioglu, I., SEVGİLİ, Ö., Azizian-Kalandaragh, Y., & ALTINDAL, Ş., (2020). Frequency-Dependent Admittance Analysis of Au/n-Si Structure with CoSO4-PVP Interfacial Layer. Journal of Electronic Materials , vol.49, no.6, 3720-3727.

Tascioglu, Ilke Et Al. "Frequency-Dependent Admittance Analysis of Au/n-Si Structure with CoSO4-PVP Interfacial Layer," Journal of Electronic Materials , vol.49, no.6, 3720-3727, 2020

Tascioglu, Ilke Et Al. "Frequency-Dependent Admittance Analysis of Au/n-Si Structure with CoSO4-PVP Interfacial Layer." Journal of Electronic Materials , vol.49, no.6, pp.3720-3727, 2020

Tascioglu, I. Et Al. (2020) . "Frequency-Dependent Admittance Analysis of Au/n-Si Structure with CoSO4-PVP Interfacial Layer." Journal of Electronic Materials , vol.49, no.6, pp.3720-3727.

@article{article, author={Ilke Tascioglu Et Al. }, title={Frequency-Dependent Admittance Analysis of Au/n-Si Structure with CoSO4-PVP Interfacial Layer}, journal={Journal of Electronic Materials}, year=2020, pages={3720-3727} }