Güçlü, Ç. Et Al. 2024. Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method. Journal of Materials Science: Materials in Electronics , vol.35, no.5 .

Güçlü, Ç., Tanrıkulu, E., ULUSOY, M., Kalandargh, Y. A., & ALTINDAL, Ş., (2024). Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method. Journal of Materials Science: Materials in Electronics , vol.35, no.5.

Güçlü, Ç.Ş. Et Al. "Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method," Journal of Materials Science: Materials in Electronics , vol.35, no.5, 2024

Güçlü, Ç.Ş. Et Al. "Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method." Journal of Materials Science: Materials in Electronics , vol.35, no.5, 2024

Güçlü, Ç. Et Al. (2024) . "Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method." Journal of Materials Science: Materials in Electronics , vol.35, no.5.

@article{article, author={Ç.Ş. Güçlü Et Al. }, title={Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method}, journal={Journal of Materials Science: Materials in Electronics}, year=2024}