DEMİREZEN, S. And Yeriskin, S. 2021. Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.20 , 25339-25349.

DEMİREZEN, S., & Yeriskin, S., (2021). Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.20, 25339-25349.

DEMİREZEN, SELÇUK, And SEÇKİN ALTINDAL YERİŞKİN. "Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.20, 25339-25349, 2021

DEMİREZEN, SELÇUK And Yeriskin, SEÇKİN A. . "Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.20, pp.25339-25349, 2021

DEMİREZEN, S. And Yeriskin, S. (2021) . "Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.20, pp.25339-25349.

@article{article, author={SELÇUK DEMİREZEN And author={SEÇKİN ALTINDAL YERİŞKİN}, title={Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2021, pages={25339-25349} }