Bayal, Ö. Et Al. 2024. HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications. Gazi University Journal of Science Part A: Engineering and Innovation , vol.11, no.2 , 264-273.

Bayal, Ö., Bilgili, A. K., KAYA, N., ÖZTÜRK, M. K., & KALAYCI, Ş., (2024). HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications. Gazi University Journal of Science Part A: Engineering and Innovation , vol.11, no.2, 264-273.

Bayal, Özlem Et Al. "HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications," Gazi University Journal of Science Part A: Engineering and Innovation , vol.11, no.2, 264-273, 2024

Bayal, Özlem Et Al. "HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications." Gazi University Journal of Science Part A: Engineering and Innovation , vol.11, no.2, pp.264-273, 2024

Bayal, Ö. Et Al. (2024) . "HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications." Gazi University Journal of Science Part A: Engineering and Innovation , vol.11, no.2, pp.264-273.

@article{article, author={Özlem Bayal Et Al. }, title={HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications}, journal={Gazi University Journal of Science Part A: Engineering and Innovation}, year=2024, pages={264-273} }