TATAROĞLU, A. And Uyar, R. E. 2016. Analysis of density and time constant of interface states of MIS device by conductance method. INDIAN JOURNAL OF PURE & APPLIED PHYSICS , vol.54, no.6 , 374-378.

TATAROĞLU, A., & Uyar, R. E., (2016). Analysis of density and time constant of interface states of MIS device by conductance method. INDIAN JOURNAL OF PURE & APPLIED PHYSICS , vol.54, no.6, 374-378.

TATAROĞLU, ADEM, And R. Ertugrul Uyar. "Analysis of density and time constant of interface states of MIS device by conductance method," INDIAN JOURNAL OF PURE & APPLIED PHYSICS , vol.54, no.6, 374-378, 2016

TATAROĞLU, ADEM And Uyar, R. E. . "Analysis of density and time constant of interface states of MIS device by conductance method." INDIAN JOURNAL OF PURE & APPLIED PHYSICS , vol.54, no.6, pp.374-378, 2016

TATAROĞLU, A. And Uyar, R. E. (2016) . "Analysis of density and time constant of interface states of MIS device by conductance method." INDIAN JOURNAL OF PURE & APPLIED PHYSICS , vol.54, no.6, pp.374-378.

@article{article, author={ADEM TATAROĞLU And author={R. Ertugrul Uyar}, title={Analysis of density and time constant of interface states of MIS device by conductance method}, journal={INDIAN JOURNAL OF PURE & APPLIED PHYSICS}, year=2016, pages={374-378} }