Ozturk, M. K. Et Al. 2010. Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.21, no.2 , 185-191.

Ozturk, M. K., Hongbo, Y., Sarikavak, B., Korcak, S., Ozcelik, S., & Ozbay, E., (2010). Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.21, no.2, 185-191.

Ozturk, M. Et Al. "Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.21, no.2, 185-191, 2010

Ozturk, M. K. Et Al. "Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.21, no.2, pp.185-191, 2010

Ozturk, M. K. Et Al. (2010) . "Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.21, no.2, pp.185-191.

@article{article, author={M. K. Ozturk Et Al. }, title={Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2010, pages={185-191} }