Selcuk, A. B. Et Al. 2007. Analysis of frequency-dependent In/SiO2/P-Si series resistance and interface states of (MIS) structures. PHYSICA B-CONDENSED MATTER , vol.400 , 149-154.

Selcuk, A. B., Tugluoglu, N., Karadeniz, S., & Ocak, S., (2007). Analysis of frequency-dependent In/SiO2/P-Si series resistance and interface states of (MIS) structures. PHYSICA B-CONDENSED MATTER , vol.400, 149-154.

Selcuk, A. Et Al. "Analysis of frequency-dependent In/SiO2/P-Si series resistance and interface states of (MIS) structures," PHYSICA B-CONDENSED MATTER , vol.400, 149-154, 2007

Selcuk, A. B. Et Al. "Analysis of frequency-dependent In/SiO2/P-Si series resistance and interface states of (MIS) structures." PHYSICA B-CONDENSED MATTER , vol.400, pp.149-154, 2007

Selcuk, A. B. Et Al. (2007) . "Analysis of frequency-dependent In/SiO2/P-Si series resistance and interface states of (MIS) structures." PHYSICA B-CONDENSED MATTER , vol.400, pp.149-154.

@article{article, author={A. Birkan Selcuk Et Al. }, title={Analysis of frequency-dependent In/SiO2/P-Si series resistance and interface states of (MIS) structures}, journal={PHYSICA B-CONDENSED MATTER}, year=2007, pages={149-154} }