Ulusan, A. B. And TATAROĞLU, A. 2018. Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure. SILICON , vol.10, no.5 , 2071-2077.

Ulusan, A. B., & TATAROĞLU, A., (2018). Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure. SILICON , vol.10, no.5, 2071-2077.

Ulusan, A., And ADEM TATAROĞLU. "Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure," SILICON , vol.10, no.5, 2071-2077, 2018

Ulusan, A. B. And TATAROĞLU, ADEM. "Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure." SILICON , vol.10, no.5, pp.2071-2077, 2018

Ulusan, A. B. And TATAROĞLU, A. (2018) . "Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure." SILICON , vol.10, no.5, pp.2071-2077.

@article{article, author={A. Buyukbas Ulusan And author={ADEM TATAROĞLU}, title={Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure}, journal={SILICON}, year=2018, pages={2071-2077} }