KARAOĞLAN, N. Et Al. 2019. Dielectric characterization of BSA doped-PANI interlayered metal-semiconductor structures. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.15 , 14224-14232.

KARAOĞLAN, N., Tecimer, H. U., ALTINDAL, Ş., & BİNDAL, C., (2019). Dielectric characterization of BSA doped-PANI interlayered metal-semiconductor structures. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.15, 14224-14232.

KARAOĞLAN, NURSEL Et Al. "Dielectric characterization of BSA doped-PANI interlayered metal-semiconductor structures," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.15, 14224-14232, 2019

KARAOĞLAN, NURSEL Et Al. "Dielectric characterization of BSA doped-PANI interlayered metal-semiconductor structures." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.15, pp.14224-14232, 2019

KARAOĞLAN, N. Et Al. (2019) . "Dielectric characterization of BSA doped-PANI interlayered metal-semiconductor structures." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.15, pp.14224-14232.

@article{article, author={NURSEL KARAOĞLAN Et Al. }, title={Dielectric characterization of BSA doped-PANI interlayered metal-semiconductor structures}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2019, pages={14224-14232} }