Y. Özen Et Al. , "Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values," Gazi Üniversitesi Fen Fakültesi Dergisi , vol.2, no.1, pp.24-33, 2021
Özen, Y. Et Al. 2021. Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values. Gazi Üniversitesi Fen Fakültesi Dergisi , vol.2, no.1 , 24-33.
Özen, Y., Efkere, H. İ., Asar, T., & Özçelik, S., (2021). Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values. Gazi Üniversitesi Fen Fakültesi Dergisi , vol.2, no.1, 24-33.
Özen, YUNUS Et Al. "Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values," Gazi Üniversitesi Fen Fakültesi Dergisi , vol.2, no.1, 24-33, 2021
Özen, YUNUS Et Al. "Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values." Gazi Üniversitesi Fen Fakültesi Dergisi , vol.2, no.1, pp.24-33, 2021
Özen, Y. Et Al. (2021) . "Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values." Gazi Üniversitesi Fen Fakültesi Dergisi , vol.2, no.1, pp.24-33.
@article{article, author={YUNUS ÖZEN Et Al. }, title={Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values}, journal={Gazi Üniversitesi Fen Fakültesi Dergisi}, year=2021, pages={24-33} }